Calibration Standards
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- Calibration Standards, Electron Microscopy
Auger Electron Microscopy MAC
- Standard 33 Elements Auger reference
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- Calibration Standards, Electron Microscopy
Backscattered Electron Detector Calibration Standard
- Backscattered Electron Detector Calibration Standard Standards to check 1 Atomic number resolution. Faraday Cup to set probe current. Duplex Brass to check 0.1 Atomic number resolution
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- Calibration Standards, Electron Microscopy
High Magnification Tin On Carbon on Grid
- This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin sphere.
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- Calibration Standards, Electron Microscopy
Low Magnification Tin On Carbon
- This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
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- Calibration Standards, Electron Microscopy
Low Voltage Resolution Gold (30nm – 500nm) on Carbon Test
- Low Voltage Resolution Au-C Test
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- Calibration Standards, Electron Microscopy
MAG*I*CAL® TEM Calibration
- Magnification Calibration Standard for Transmission Electron Microscopes
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- Calibration Standards, Electron Microscopy
Medium Resolution Aluminum Tungsten Dendrites
- The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean. It is most useful for working in the probe size range of 25 to 75 nm
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- Calibration Standards, Electron Microscopy
Medium Resolution Gold (0.1μm – 1μm) on Carbon Test
- Medium Resolution Au-C Test