Description
AFM Super Sharp Improved Super Cone Cantilever Probes
Super sharp tip for tapping or non contact mode.
Application
Surface Roughness
Topography Imaging
| Tip Apex Specifications | |
| Radius: | < 5 nm |
| Full cone angle: | < 5° for ~ 150 nm |
| Tip height: | > 9 µm |
| Available Cantilevers: | |
| C = 40 N/m, fo = 300 kHz | |
| C = 3.0 N/m, fo = 75 kHz | |
| C = 0.7 N/m, fo = 45 kHz | |
| C = 0.2 N/m, fo = 15 kHz | |
Available in Pack of 5 pcs
