AFM Hemisperical Cone Shaped Cantilever Probes

Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers.

These tips are coated with metal carbide.

Available in Pack of 5 pcs

Description

Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers.

These tips are coated with metal carbide.

Application

Surface

Nano indentation

Tip Apex Specifications
Radius: 20 nm  – 40 nm  –  60 nm
Full cone angle: ~ 20°
Tip height: > 9 µm
Tip Radius Specifications
Nominal Radius Radius Range
20 nm < 20 nm
40 nm < 20 nm – 40 nm
60 nm < 40 nm – 60  nm
Available Cantilevers:
C = 0.2 N/m, fo = 15 kHz
C = 3.0 N/m, fo = 75 kHz
C = 40 N/m, fo = 300 kHz
C = 250 N/m, fo = 575 kHz
C = 750 N/m, fo = 830 kHz

 

Available in Pack of 5 pcs

Reviews

There are no reviews yet.

Be the first to review “AFM Hemisperical Cone Shaped Cantilever Probes”

Your email address will not be published.