AFM Hemisperical Cone Shaped Cantilever Probes
Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers.
These tips are coated with metal carbide.
Available in Pack of 5 pcs
Description
Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers.
These tips are coated with metal carbide.
Application
Surface
Nano indentation
| Tip Apex Specifications | |
| Radius: | 20 nm – 40 nm – 60 nm |
| Full cone angle: | ~ 20° |
| Tip height: | > 9 µm |
| Tip Radius Specifications | |
| Nominal Radius | Radius Range |
| 20 nm | < 20 nm |
| 40 nm | < 20 nm – 40 nm |
| 60 nm | < 40 nm – 60 nm |
| Available Cantilevers: | |
| C = 0.2 N/m, fo = 15 kHz | |
| C = 3.0 N/m, fo = 75 kHz | |
| C = 40 N/m, fo = 300 kHz | |
| C = 250 N/m, fo = 575 kHz | |
| C = 750 N/m, fo = 830 kHz | |
Available in Pack of 5 pcs
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