AFM Super Sharp Improved Super Cone Cantilever Probes

AFM Super Sharp Improved Super Cone Cantilever Probes

Super sharp tip for tapping or non contact mode.

Available in Pack of 5 pcs

Description

AFM Super Sharp Improved Super Cone Cantilever Probes

Super sharp tip for tapping or non contact mode.

Application

Surface Roughness

Topography Imaging

Tip Apex Specifications
Radius: < 5 nm
Full cone angle: < 5° for ~ 150 nm
Tip height: > 9 µm
Available Cantilevers:
C = 40 N/m, fo = 300 kHz
C = 3.0 N/m, fo = 75 kHz
C = 0.7 N/m, fo = 45 kHz
C = 0.2 N/m, fo = 15 kHz

 

Available in Pack of 5 pcs

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