AFM Improved Super Cone Cantilever Probes

Multipurpose tip for simultaneous measurement of roughness and large step height.

Available in Pack of 5 pcs

 

Description

AFM Improved Super Cone Cantilever Probes

Multipurpose tip for simultaneous measurement of roughness and large step height.

Application

Surface Roughness

Topography Imaging

Step Height Measurements

Tip Apex Specifications
Radius: < 10 nm
Full cone angle: < 10° for > 3 µm
Tip height: > 9 µm
Available Cantilevers:
C = 40 N/m, fo = 300 kHz
C = 3.0 N/m, fo = 75 kHz
C = 0.7 N/m, fo = 45 kHz
C = 0.2 N/m, fo = 15 kHz

 

Available in Pack of 5 pcs

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