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- AFM and STM Supplies
AFM Hemisperical Cone Shaped Cantilever Probes
- Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers. These tips are coated with metal carbide. Available in Pack of 5 pcs
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- AFM and STM Supplies
AFM High Resolution Solid Carbon Cone Probes
- AFM High resolution Solid Carbon Cone Probes High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures. Available in Pack of 5 pcs
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- AFM and STM Supplies
AFM Improved Super Cone Cantilever Probes
- Multipurpose tip for simultaneous measurement of roughness and large step height. Available in Pack of 5 pcs
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- AFM and STM Supplies
AFM Large Radius Hemispherical Cantilever Probes
- Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface. Available in Pack of 5 pcs
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- AFM and STM Supplies
AFM Super Sharp Improved Super Cone Cantilever Probes
- AFM Super Sharp Improved Super Cone Cantilever Probes Super sharp tip for tapping or non contact mode. Available in Pack of 5 pcs
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- AFM and STM Supplies
Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
- Gold Coated 4" Silicon Wafer, P-Type <100> Gold Coated 2" Silicon Wafer, P-Type <100>
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- AFM and STM Supplies
Gold Coated Microscope Slide
- 25 x 75 x 1 (mm)
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- AFM and STM Supplies
Gold Coated Square Coverslips
- Gold Coated Square Coverslips 22 x 22 x 0.2 (mm)
