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- AFM and STM Supplies
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- Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers. These tips are coated with metal carbide. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- AFM High resolution Solid Carbon Cone Probes High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- Multipurpose tip for simultaneous measurement of roughness and large step height. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- AFM Super Sharp Improved Super Cone Cantilever Probes Super sharp tip for tapping or non contact mode. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- Gold Coated 4" Silicon Wafer, P-Type <100> Gold Coated 2" Silicon Wafer, P-Type <100>
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- AFM and STM Supplies
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- High resolution magnetic force microscopy probes High resolution magnetic probe tip with Co-alloy hard magnetic coating. Magnetic coating is applied to tip side only. Coating thickness is measured on flat surface. Standard coating on backside of cantilever is Aluminium. Available in Pack of 5 pcs
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- AFM and STM Supplies
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- Silver Coated 4" Silicon Wafer, P-Type <100> 100 mm dia. 0.525 mm thickness Silver Coated 2" Silicon Wafer, P-Type <100> 50 mm dia. 0.279 mm thickness
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