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Lab Consumables Microscope Singapore
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    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Cold Mounting Resins
      • Hot Mounting Resins
      • Diamond Cutting WheelDiamond Cutting Wheel
      • Diamond Lapping Film
      • Diamond SuspensionDiamond Suspension Mechanical polishing cross section lab service
      • Metallographic System
      • Mounting AccessoriesMounting Accessories
      • Polishing ClothPolishing Cloth
      • Precision Cutting SystemPrecision Cutting System
      • Silicon Carbide Paper DiscSilicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Adhesive Backing Paper
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Non Adhesive Backing Paper
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope SlidesPlastic and glass microscope slides to hold materials for examination under a microscope for observation.
      • Slide Warmers
      • Plastic Acid Resistant TweezerPlastic Acid Resistant Tweezer
      • Wafer TweezerWafer Tweezer
      • ESD TweezerESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars RodsStirring Magnetic Bars Rods
      • Centrifuges Tubes RacksCentrifuges Tubes Racks General Lab Consumables
      • OrganizerOrganizer Centrifuges Tubes Racks General Lab Consumables
      • Plastic Transfer PipettesPlastic Transfer Pipettes
      • Scriber Cleaving PlierScriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration StandardsCalibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology MicrobiologyHistology Microbiology
  • Application
    • Diamond Lapping Film
    • Organic Scanning Electron Microscopy
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Energy dispersive X-ray spectroscopy EDS
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Electrical Validation
      • IV Curve Trace
  • About Us
    • Quality Policy
    • Contact Us
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  • Home
  • Products
    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Cold Mounting Resins
      • Hot Mounting Resins
      • Diamond Cutting Wheel
      • Diamond Lapping Film
      • Diamond Suspension
      • Metallographic System
      • Mounting Accessories
      • Polishing Cloth
      • Precision Cutting System
      • Silicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope Slides
      • Slide Warmers
      • Plastic Acid Resistant Tweezer
      • Wafer Tweezer
      • ESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars Rods
      • Centrifuges Tubes Racks
      • Organizer
      • Plastic Transfer Pipettes
      • Scriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology Microbiology
  • Application
    • Diamond Lapping Film
    • Organic Scanning Electron Microscopy
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Energy dispersive X-ray spectroscopy EDS
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Electrical Validation
      • IV Curve Trace
  • About Us
    • Quality Policy
    • Contact Us
  • Store Cart
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  • AFM Hemisperical Cone Shaped Cantilever Probes Quick View
    • AFM Hemisperical Cone Shaped Cantilever Probes Quick View
    • AFM and STM Supplies
    • AFM Hemisperical Cone Shaped Cantilever Probes

    • Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers. These tips are coated with metal carbide. Available in Pack of 5 pcs
  • AFM High Resolution Solid Carbon Cone Probes Quick View
    • AFM High Resolution Solid Carbon Cone Probes Quick View
    • AFM and STM Supplies
    • AFM High Resolution Solid Carbon Cone Probes

    • AFM High resolution Solid Carbon Cone Probes High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures. Available in Pack of 5 pcs
  • AFM Improved Super Cone Cantilever Probes Quick View
    • AFM Improved Super Cone Cantilever Probes Quick View
    • AFM and STM Supplies
    • AFM Improved Super Cone Cantilever Probes

    • Multipurpose tip for simultaneous measurement of roughness and large step height. Available in Pack of 5 pcs  
  • AFM Large Radius Hemispherical Cantilever Probes Quick View
    • AFM Large Radius Hemispherical Cantilever Probes Quick View
    • AFM and STM Supplies
    • AFM Large Radius Hemispherical Cantilever Probes

    • Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface. Available in Pack of 5 pcs
  • AFM Super Sharp Improved Super Cone Cantilever Probes Quick View
    • AFM Super Sharp Improved Super Cone Cantilever Probes Quick View
    • AFM and STM Supplies
    • AFM Super Sharp Improved Super Cone Cantilever Probes

    • AFM Super Sharp Improved Super Cone Cantilever Probes Super sharp tip for tapping or non contact mode. Available in Pack of 5 pcs
  • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100 Quick View
    • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100 Quick View
    • AFM and STM Supplies
    • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100

    • Gold Coated 4" Silicon Wafer, P-Type <100> Gold Coated 2" Silicon Wafer, P-Type <100>
  • Gold Coated Microscope Slide Quick View
    • Gold Coated Microscope Slide Quick View
    • AFM and STM Supplies
    • Gold Coated Microscope Slide

    • 25 x 75 x 1 (mm)
  • Gold Coated Square Coverslips Quick View
    • Gold Coated Square Coverslips Quick View
    • AFM and STM Supplies
    • Gold Coated Square Coverslips

    • Gold Coated Square Coverslips 22 x 22 x 0.2 (mm)
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Link

  • https://www.fractiontechnologies.com/

Contact Info

  • Address:51 CHANGI BUSINESS PARK CENTRAL 2 THE SIGNATURE #04-05 SINGAPORE 486066
  • Phone:+6586613002
  • Email:sales@fractiontechnologies.comOpens in your application

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