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      • Stage Calibration Standards Micrometer
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      • Digital Microscope Leica DVM6
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      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Cold Mounting Resins
      • Hot Mounting Resins
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      • Silicon Carbide Paper DiscSilicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Adhesive Backing Paper
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Non Adhesive Backing Paper
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
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      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope SlidesPlastic and glass microscope slides to hold materials for examination under a microscope for observation.
      • Slide Warmers
      • Plastic Acid Resistant TweezerPlastic Acid Resistant Tweezer
      • Wafer TweezerWafer Tweezer
      • ESD TweezerESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars RodsStirring Magnetic Bars Rods
      • Centrifuges Tubes RacksCentrifuges Tubes Racks General Lab Consumables
      • OrganizerOrganizer Centrifuges Tubes Racks General Lab Consumables
      • Plastic Transfer PipettesPlastic Transfer Pipettes
      • Scriber Cleaving PlierScriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration StandardsCalibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology MicrobiologyHistology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Energy dispersive X-ray spectroscopy EDS
    • Focus Ion Beam
    • Scanning Acoustic Microscopy
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
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  • Home
  • Products
    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Cold Mounting Resins
      • Hot Mounting Resins
      • Diamond Cutting Wheel
      • Diamond Lapping Film
      • Diamond Suspension
      • Metallographic System
      • Mounting Accessories
      • Polishing Cloth
      • Precision Cutting System
      • Silicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope Slides
      • Slide Warmers
      • Plastic Acid Resistant Tweezer
      • Wafer Tweezer
      • ESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars Rods
      • Centrifuges Tubes Racks
      • Organizer
      • Plastic Transfer Pipettes
      • Scriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Energy dispersive X-ray spectroscopy EDS
    • Focus Ion Beam
    • Scanning Acoustic Microscopy
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
  • About Us
    • Quality Policy
  • Contact Us
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  • 7 Series A Tungsten Wire .005″ Point Probe Quick View
    • 7 Series A Tungsten Wire .005″ Point Probe Quick View
    • Electrical Testing, Probe Tips
    • 7 Series A Tungsten Wire .005″ Point Probe

    • Taper Profile Straight Available : 0.35 um, 0.5 um, 0.75 um, 1 um Included Angle: 14 Deg Overall Length: 1.20” Material: Tungsten Tip, Nickel-S shank. 20 pcs/ box
  • 7 Series Beryllium Copper Probe Quick View
    • 7 Series Beryllium Copper Probe Quick View
    • Electrical Testing, Probe Tips
    • 7 Series Beryllium Copper Probe

    • Taper Profile Straight Point radius: 5 um, 7 um,  10 um, 12.5 um, 20 um, 25 um. Included Angle: 14 Deg Taper Length: 4: 1 Overall Length: 1.20” Material: Beryllium Copper
  • 7 Series Gold Plated Tungsten Probe Quick View
    • 7 Series Gold Plated Tungsten Probe Quick View
    • Electrical Testing, Probe Tips
    • 7 Series Gold Plated Tungsten Probe

    • Taper Profile Straight Point radius: 5 um, 7 um, 10 um, 12.5 um, 15 um, 20 um, 25 um, 50 um Included Angle: 14 Deg Taper Length: 4: 1 Overall Length: 1.20” Material: Gold Plated Tungsten Probe 50 pcs/box
  • 7 Series TB Tungsten 20 mil Diameter Shank Probe Quick View
    • 7 Series TB Tungsten 20 mil Diameter Shank Probe Quick View
    • Electrical Testing, Probe Tips
    • 7 Series TB Tungsten 20 mil Diameter Shank Probe

    • Taper Profile Straight Point radius: 0.6 um, 0.75 um, 1 um, 1.2 um, 2 um, 5 um, 7 um Included Angle: 19 Deg Taper Length: 3: 1 Overall Length: 1.25” Material: Tungsten 20 pcs/ box
  • 7 Series X Tungsten Wire .003″ Point Probe Quick View
    • 7 Series X Tungsten Wire .003″ Point Probe Quick View
    • Electrical Testing, Probe Tips
    • 7 Series X Tungsten Wire .003″ Point Probe

    • Taper Profile Straight Point radius: 0.1 um, 0.25 um, 0.35 um, 0.5 um Included Angle: 14 Deg Taper Length: 4: 1 Overall Length: 1.20” Material: Tungsten wire nickel-S shank diameter 20 pcs/ box

Contact Info

  • Address:51 CHANGI BUSINESS PARK CENTRAL 2 THE SIGNATURE #04-05 SINGAPORE 486066
  • Phone:+6586613002
  • Email:sales@fractiontechnologies.comOpens in your application

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