AFM Large Radius Hemispherical Cantilever Probes

Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface.

Available in Pack of 5 pcs

Description

Atomic force microscope AFM , nano indentation probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface.

Application

Surface

Nano indentation

Topography Imaging

Step Height Measurements

Tip Apex Specifications
Radius: 250 nm  –  500 nm  –  750 nm
Full cone angle: ~ 40°
Tip height: > 9 µm
Tip Radius Specifications
Nominal Radius Radius Range
250 nm 150 nm – 350 nm
500 nm 350 nm – 650 nm
750 nm 600 nm – 900 nm
Available Cantilevers:
C = 0.2 N/m, fo = 15 kHz
C = 3.0 N/m, fo = 75 kHz
C = 40 N/m, fo = 300 kHz
C = 250 N/m, fo = 575 kHz
C = 750 N/m, fo = 830 kHz

 

Available in Pack of 5 pcs

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