AFM Large Radius Hemispherical Cantilever Probes
Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface.
Available in Pack of 5 pcs
Description
Atomic force microscope AFM , nano indentation probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface.
Application
Surface
Nano indentation
Topography Imaging
Step Height Measurements
| Tip Apex Specifications | |
| Radius: | 250 nm – 500 nm – 750 nm |
| Full cone angle: | ~ 40° |
| Tip height: | > 9 µm |
| Tip Radius Specifications | |
| Nominal Radius | Radius Range |
| 250 nm | 150 nm – 350 nm |
| 500 nm | 350 nm – 650 nm |
| 750 nm | 600 nm – 900 nm |
| Available Cantilevers: | |
| C = 0.2 N/m, fo = 15 kHz | |
| C = 3.0 N/m, fo = 75 kHz | |
| C = 40 N/m, fo = 300 kHz | |
| C = 250 N/m, fo = 575 kHz | |
| C = 750 N/m, fo = 830 kHz | |
Available in Pack of 5 pcs
Be the first to review “AFM Large Radius Hemispherical Cantilever Probes”
Reviews
There are no reviews yet.