AFM High Resolution Solid Carbon Cone Probes

AFM High resolution Solid Carbon Cone Probes

High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures.

Available in Pack of 5 pcs

Description

AFM High Resolution Solid Carbon Cone Probes

High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures.

Tip Apex Specifications
Radius: ~ 3 nm
Full cone angle: > 300 nm
Tip height: > 9 µm
Available Cantilevers:
C = 40 N/m, fo = 300 kHz
C = 3.0 N/m, fo = 75 kHz
C = 0.7 N/m, fo = 45 kHz
C = 0.2 N/m, fo = 15 kHz

 

Available in Pack of 5 pcs

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