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    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Diamond Cutting WheelDiamond Cutting Wheel
      • Diamond Lapping Film
      • Metallographic System
      • Mounting AccessoriesMounting Accessories
      • Polishing ClothPolishing Cloth
      • Precision Cutting SystemPrecision Cutting System
      • Silicon Carbide Paper DiscSilicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Adhesive Backing Paper
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 InchSilicon Carbide Non Adhesive Backing Paper
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope SlidesPlastic and glass microscope slides to hold materials for examination under a microscope for observation.
      • Slide Warmers
      • Plastic Acid Resistant TweezerPlastic Acid Resistant Tweezer
      • Wafer TweezerWafer Tweezer
      • ESD TweezerESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars RodsStirring Magnetic Bars Rods
      • Centrifuges Tubes RacksCentrifuges Tubes Racks General Lab Consumables
      • OrganizerOrganizer Centrifuges Tubes Racks General Lab Consumables
      • Plastic Transfer PipettesPlastic Transfer Pipettes
      • Scriber Cleaving PlierScriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration StandardsCalibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology MicrobiologyHistology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Mechanical Cross Sectioning
    • Energy dispersive X-ray spectroscopy EDS
    • Focused Ion Beam
    • Scanning Acoustic Microscopy
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
    • Wire Pull Test
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  • Home
  • Products
    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Diamond Cutting Wheel
      • Diamond Lapping Film
      • Metallographic System
      • Mounting Accessories
      • Polishing Cloth
      • Precision Cutting System
      • Silicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope Slides
      • Slide Warmers
      • Plastic Acid Resistant Tweezer
      • Wafer Tweezer
      • ESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars Rods
      • Centrifuges Tubes Racks
      • Organizer
      • Plastic Transfer Pipettes
      • Scriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Mechanical Cross Sectioning
    • Energy dispersive X-ray spectroscopy EDS
    • Focused Ion Beam
    • Scanning Acoustic Microscopy
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
    • Wire Pull Test
  • About Us
    • Quality Policy
  • Contact Us
  • 0
  • Toggle website search
  • Home
  • Products
    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Diamond Cutting Wheel
      • Diamond Lapping Film
      • Metallographic System
      • Mounting Accessories
      • Polishing Cloth
      • Precision Cutting System
      • Silicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope Slides
      • Slide Warmers
      • Plastic Acid Resistant Tweezer
      • Wafer Tweezer
      • ESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars Rods
      • Centrifuges Tubes Racks
      • Organizer
      • Plastic Transfer Pipettes
      • Scriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Mechanical Cross Sectioning
    • Energy dispersive X-ray spectroscopy EDS
    • Focused Ion Beam
    • Scanning Acoustic Microscopy
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
    • Wire Pull Test
  • About Us
    • Quality Policy
  • Contact Us
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  • Advanced High End Grinding & Polishing System Quick View
    • Advanced High End Grinding & Polishing System Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Advanced High End Grinding & Polishing System

    • Advanced High End Grinding & Polishing system. Accuracy is ideal for applications requiring extremely flat specimen surfaces, from very coarse grinding to very fine grinding and polishing. • Suitable for both 250 mm and 300 mm applications.
  • Aku Disp Peristaltic Dispenser Quick View
    • Aku Disp Peristaltic Dispenser Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Aku Disp Peristaltic Dispenser

    • Aku-Disp is designed to work in conjunction with the  Forcipol individually or with the Forcipol/Forcimat combined. The  aKu-Disp operates whilst the machine is running to provide accurate metered dosing of abrasive slurry to the grinding/polishing application
  • Automatic Hot Mounting Presses Quick View
    • Automatic Hot Mounting Presses Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Automatic Hot Mounting Presses

    • The Ecopress 102 and 202 are high capacity, state of the art, automatic mounting presses with advanced software and programmable coloured HMI screen
  • Ecopress 52 Hot Mounting System Quick View
    • Ecopress 52 Hot Mounting System Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Ecopress 52 Hot Mounting System

    • Ecopress 52 is a fully automatic, cost effective, digital mounting press, suitable for all hot mounting materials currently used in materialography
  • Electrolytic Polishing & Etching Machine Quick View
    • Electrolytic Polishing & Etching Machine Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Electrolytic Polishing & Etching Machine

    • A fully automatic, electrolytic polishing and etching instrument, the Eloprep features an independent control unit, offering shorter preparation time compared to traditional mechanical preparation
  • Forcimat – Automatic Head units for Forcipol Quick View
    • Forcimat – Automatic Head units for Forcipol Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Forcimat – Automatic Head units for Forcipol

    • Mounted on the rigid post fixed to the base of all the Forcipol machines, the Forcimat Automatic Heads can prepare 6 samples  simultaneously. The sample holder is easily positioned with a quick-locking clamping mechanism
  • FORCIMAT 52 Semi Automatic Polishing Head Quick View
    • FORCIMAT 52 Semi Automatic Polishing Head Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • FORCIMAT 52 Semi Automatic Polishing Head

    • Microprocessor controlled, pneumatically adjustable individual force loading system, up to 6 specimens, quick specimen holder replacement system, 100 Watt DC motor, variable rotational speed between 50-150 rpm, with robust steel mounting column, front panel with touch-pad controls and digital display, with ergonomic turn knob for fast and easy setting of parameters, last parameter settings retained in the memory, automatic disc…
  • FORCIPOL 102 Quick View
    • FORCIPOL 102 Quick View
    • Metallographic System
    • FORCIPOL 102

  • Metallography Grinding and Polishing Machines Quick View
    • Metallography Grinding and Polishing Machines Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Metallography Grinding and Polishing Machines

    • FORCIPOL Series of instruments are available as Single wheel (FORCIPOL 102) and Dual wheel (FORCIPOL 202) Units. FORCIPOL instruments can be used for grinding, lapping and polishing with magnetic backed discs and cloths or by quick and simple exchange of wheels. When the number of specimens to be prepared increases, FORCIPOL instruments can be fitted with FORCIMAT automatic head for…
  • Vacuum Impregnation Unit Quick View
    • Vacuum Impregnation Unit Quick View
    • Metallographic Lapping Polishing, Metallographic System
    • Vacuum Impregnation Unit

    • Designed for embedding and impregnation of porous materials, these units remove the trapped air from the mounting material and eliminate any gaps between the specimen and resin.

Contact Info

  • Address:51 CHANGI BUSINESS PARK CENTRAL 2 THE SIGNATURE #04-05 SINGAPORE 486066
  • Phone:+6586613002
  • Email:sales@fractiontechnologies.comOpens in your application

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