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      • Upright Microscope Leica DM750
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      • Upright Microscope Leica DM4 M
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      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
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      • Ion Beam Milling System Leica EM TIC 3X
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    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
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    • General Lab Consumables
      • Plastic and Glass Microscope SlidesPlastic and glass microscope slides to hold materials for examination under a microscope for observation.
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    • AFM and STM Supplies
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      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration StandardsCalibration Standards
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    • Electrical Validation
      • IV Curve Trace
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  • Home
  • Products
    • Leica Microscope
      • Stage Calibration Standards Micrometer
      • Confocal Interferometry Microscope Leica DCM8
      • Digital Microscope Leica DVM6
      • Digital Microscope Leica DMS1000
      • Digital Microscope Leica DMS1000 B
      • Inverted Microscope Leica DMi8
      • Inverted Microscope Leica DM ILM
      • Stereo Microscope Leica EZ4 W EZ4 E
      • Stereo Microscope Fluorescent Leica M165 FC
      • Stereo Microscope Leica LED3000 RL
      • Stereo Microscope Leica LED5000 RL
      • Upright Microscope Leica DM750
      • Upright Microscope Leica DM 2700 M
      • Upright Microscope Leica DM6
      • Upright Microscope Leica DM4 M
    • Leica EM
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
      • Leica EM RAPID Pharmaceutical Milling System
      • Leica EM TXP
      • Leica EM TRIM2
      • Ion Beam Milling System Leica EM TIC 3X
    • Sputter Targets
      • Platinum Palladium 80/20 Target
      • Palladium Target
      • Gold Palladium 60/40 Target
      • Tantalum Target
      • Molybdenum Target
      • Cobalt Target
      • Iron Fe Target
      • Tungsten Target
      • Ti Target
      • Chromium Target
      • Copper Target
      • Nickel Target
      • Iridium Target
      • Tungsten Wire
      • Precious Metal Wires
    • Sputter Coater and E Beam Coater
      • Sputter Carbon E Beam Coater Leica EM ACE 600
      • Low Vacuum Coater Leica EM ACE 200
    • Metallographic Lapping Polishing
      • Cold Mounting Resins
      • Hot Mounting Resins
      • Diamond Cutting Wheel
      • Diamond Lapping Film
      • Diamond Suspension
      • Metallographic System
      • Mounting Accessories
      • Polishing Cloth
      • Precision Cutting System
      • Silicon Carbide Paper Disc
        • Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
        • Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
    • Carbon Rods and Graphite Rods
      • Carbon Rods Spectro Grade
      • Carbon Rods Technical Grade
      • Carbon Rods Pointed Presharpened
      • Carbon Rods Presharpened Double Points
      • Carbon Fiber Cord
      • Carbon Rod Sharpener Manual
      • Carbon Rod Sharpener Hand Tool Two Step Carbon Rods
    • General Lab Consumables
      • Plastic and Glass Microscope Slides
      • Slide Warmers
      • Plastic Acid Resistant Tweezer
      • Wafer Tweezer
      • ESD Tweezer
      • Beaker Bottles Cylinder Tubes
      • Stirring Magnetic Bars Rods
      • Centrifuges Tubes Racks
      • Organizer
      • Plastic Transfer Pipettes
      • Scriber Cleaving Plier
    • AFM and STM Supplies
      • SPM AFM SEM Calibration Standards
      • AFM Large Radius Hemispherical Cantilever Probes
      • AFM Hemisperical Cone Shaped Cantilever Probes
      • AFM Improved Super Cone Cantilever Probes
      • AFM Super Sharp Improved Super Cone Cantilever Probes
      • AFM High Resolution Solid Carbon Cone Probes
      • Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
      • Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
    • Electron Microscopy
      • Calibration Standards
      • Conductive Adhesives Tapes
      • Focus Ion Beam Consumables
      • Organic Starter Kit
      • Specimen Mounts for EBSD
      • Specimen Mounts for SEM
      • Transmission Electron Microscopy Grids
    • Cryo Supplies
    • Cleanroom & Safety Product
    • Histology Microbiology
    • Electrical Testing Consumables
      • Probe Station
      • Micropositioner
      • Probe Tips
  • Innovation Center Services
    • BGA Rework and Reballing
    • Coordinate Measuring Machine CMM
    • Scanning Electron Microscope SEM
    • 3D Reconstruction
    • Metallographic Specimen Preparation
    • Energy dispersive X-ray spectroscopy EDS
    • Broad Ion Beam
    • 2D X-ray Imaging
    • Chemical Decapsulation
    • Electrical Validation
      • IV Curve Trace
  • About Us
    • Quality Policy
  • Contact Us
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  • Low Vacuum Coater Leica EM ACE 200 Quick View
    • Low Vacuum Coater Leica EM ACE 200 Quick View
    • Leica EM, Sputter Coater and E Beam Coater
    • Low Vacuum Coater Leica EM ACE 200

    • Leica EM ACE200 Low Vacuum Coater producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never before more convenient than with the Leica EM ACE200 coating system. Configured as a sputter coater or carbon thread evaporation coater, perfectly reproducible results can be achieved  in the fully automated system. If both methods are required for your…
  • Sputter carbon and e beam coater Leica EM ACE 600 Quick View
    • Sputter carbon and e beam coater Leica EM ACE 600 Quick View
    • Leica EM, Sputter Coater and E Beam Coater
    • Sputter carbon and e beam coater Leica EM ACE 600

    • The EM ACE600 sputter coater is a versatile high vacuum film deposition instrument for your FE-SEM and TEM applications. Whether you need to enhance contrast by a fine-grained metal layer, produce nanometer thin but robust carbon films, rotary shadow your sample to make smallest features visible, or to move into cryo-coating

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