Leica EM TXP
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.
An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.
With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
Leica EM TXP
The Leica EM TXP is a unique target preparation device especially developed for cutting and polishing samples prior to examination by SEM, TEM and LM techniques. It excels with challenging specimens easy. Before the Leica EM TXP,
sawing, milling, grinding and polishing exactly to the target was often a very time-consuming and difficult procedure as points of interest were easily missed and specimens often difficult to handle due to their small size. With the
Leica EM TXP such samples can easily be prepared. Furthermore, due to its versatility, the EM TXP is a very efficient tool for sample pre-preparation prior to ion beam milling and ultramicrotomy.
Stereomicroscopic target observation during the working process. With the specimen pivot arm the sample can be observed during preparation at an angle between 0° and 60°, directly onto the front face, or 90° to the front face for distance determination with an eyepiece graticule.
The Leica EM TXP features brilliant ring LED top light and optimized backlight illumination for excellent viewing.
Accurate location and preparation of micro targets
> In-situ observation with a stereomicroscope
> Multifunctional machine processing
> Automatic process control to produce a mirror-like surface quality
> Brightness control and segment selection of LED-ring illumination