Atomic force microscope AFM , nano indentation probes with hemispherical tip shape, the ideal application is material characterization by nano indentation on bio-medical materials, polymers. These tips are coated with metal carbide. Available in Pack of 5 pcs
AFM High resolution Solid Carbon Cone Probes High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures. Available in Pack of 5 pcs
Atomic Force Microscope AFM , Nano indentation Probes with large radius hemispherical probes tip shape, the ideal application for material characterization by nano indentation and large area scanning surface. Available in Pack of 5 pcs