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- Electron Microscopy, Focus Ion Beam Consumables
Molybdenum 4 Post Lift Out Grids
- Focus Ion Beam Sample Preparation Lift-Out Grids
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- Electron Microscopy, Focus Ion Beam Consumables
XA ½” Tungsten Probe Tips
- Custom tip designed from tungsten. Tip radius is < 0.5µm with 13° taper angle for maximum lifetime service.
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- Electron Microscopy, Focus Ion Beam Consumables
XA Short Cut Probe Tips
- Custom tip designed from tungsten. Tip radius is < 0.5µm with 6° taper angle for maximum lifetime service. Compatible with Short-Cut™ system for direct conversion to TEM grid.