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- Electron Microscopy, Focus Ion Beam Consumables
AP 200 250 Tungsten Probe Tips
- Custom tip designed from tungsten. Tip radius is < 0.5µm with 6° taper angle for maximum lifetime service. Compatible with Short-Cut™ system for direct conversion to TEM grid.
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- Electron Microscopy, Focus Ion Beam Consumables
Beryllium Half-Ring Grids
- Focus ion Beam Sample Preparation Lift-Out Grids Beryllium Half Ring Grids
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- Electron Microscopy, Focus Ion Beam Consumables
Copper 3 Post Lift Out Grids Side Access
- Focus Ion Beam Sample Preparation Lift-Out Grids
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- Electron Microscopy, Focus Ion Beam Consumables
Copper 3 Post Lift Out Grids, Shallow Downset
- Focus ion Beam Sample Preparation Lift-Out Grid
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- Electron Microscopy, Focus Ion Beam Consumables
Copper 4-Post Lift-Out Grids
- Focus ion Beam Sample Preparation Lift-Out Grid
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- Electron Microscopy, Focus Ion Beam Consumables
Copper 5 Post Lift Out Grids
- Focus ion Beam Sample Preparation Lift Out Grid Copper 5 Post Lift Out Grids
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- Electron Microscopy, Focus Ion Beam Consumables
In-Situ Probe Tips
- Custom tungsten tip with a stainless-steel shank, for use with AutoProbe™ 300, in-situ probe tip exchange systems and Short-Cut™. Tip radius is 0.5µm with 8-10° taper angle. This tip is also Short-Cut™ compatible.
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- Electron Microscopy, Focus Ion Beam Consumables
Molybdenum 3 Post Lift-Out Grids
- Focus Ion Beam Sample Preparation Lift-Out Grids Molybdenum 3 Post Lift Out Grids